When a global provider of air traffic, navigation, and landing system solutions began implementing its next-generation system, limitations of an existing test and debug methodology directly impacted ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

HiDFT-Scan Analyzes, Implements Scan Test Structures in Register-Transfer Level Designs; Closes Historical Gap between RTL and DFT PALO ALTO, Calif.--October 22, 2007--DeFacTo Technologies today ...

Astrotech Corporation has launched a new subsidiary, EN-SCAN, Inc., focused on manufacturing and selling advanced environmental testing instruments utilizing its proprietary gas chromatography and ...