Abstract: Capacitance testing is the most important for the service bushing condition assessment. However, for the new Resin Impregnated Paper (RIP) bushing used in EGAT, the repeatable test result ...

This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor ...

Keithley Instruments has announced a new CV (capacitance/voltage)-measurement-instrument module for its model 4200-SCS (semiconductor-characterization system). The ...

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CAMBRIDGE, UK — On Thursday, 29 October, at 14:00 GMT, Keithley Instruments Inc., will host a free 45-minute online seminar about the fundamentals of testing semiconductor capacitance and voltage. The ...