(Nanowerk News) The roughness of a surface can make all the difference in nanoscale devices. Measuring the roughness of such delicate surfaces in the hard-to-reach places of nanodevices, however, is ...

The Universal Scanning Interferometry (USI) measurement mode has been recently released by Bruker to provide universal measurement results on a broad range of surfaces for ContourX white light ...

Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI). Software capabilities include measurements ...

Wide bandgap semiconductor materials are highly useful in power electronics due to their ability to work at high temperatures, power, and frequency. Gallium nitride (GaN) is a wide bandgap ...

Please contact the ARC Core Labs for questions and assistance. Contact Us Profilm3D surface profiler provides sub-nanometer vertical resolution using vertical-scanning interferometry (VSI) and ...