Abstract We present a simple method to quantitatively capture the heterogeneity in the degree distribution of a network graph using a single parameter σ . Using an exponential transformation of the ...

Abstract We present a simple method to quantitatively capture the heterogeneity in the degree distribution of a network graph using a single parameter σ. Using an exponential transformation of the ...

Abstract: This paper describes a method for predicting transistor reliability as a function of nuclear radiation exposure, through the use of the Weibull distribution. Graphical plots of seven ...

Here’s a way to calculate the reliability for designs with several subsystems. • Weibull plots fit a curve through data, not data to a predetermined distribution’s curve. • After evaluating subsystems ...