This example compares the use of three-parameter and two-parameter Weibull Q-Q plots for the failure times in months for 48 integrated circuits. The times are assumed to follow a Weibull distribution.
Abstract: We provide new insights, via nanoscale TDDB testing, into the bimodal Weibull failure distribution obtained from area scaling of high-κ (HK) gate stack. Time-to-breakdown (BD) statistics for ...
In this paper, we consider the construction of the approximate profile-likelihood confidence intervals for parameters of the 2-parameter Weibull distribution based on small type-2 censored samples. In ...
"Create the failure times array and the analysis object. When the analysis is initialized with data, it creates values for the shape parameter, $\\beta$, and the scale parameter, $\\eta$." ...
Abstract: Time Between Events (TBE) charts have advantages over the traditional control charts when monitoring high quality processes with very low defect rates. This article introduces a new discrete ...
Using the Weibull distribution to model gold wire bonding on ENEPIG. The most used distribution in reliability analysis may be the Weibull distribution. Its genesis can be traced back to Waloddi ...
ABSTRACT: Lifetime analyses frequently apply a parametric functional description from measured data of the Kaplan-Meier non-parametric estimate (KM) of the survival probability. The cumulative Weibull ...
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