Abstract—The continuous advancement in VLSI (Very-Large- Scale Integration) technology necessitates robust and efficient testing methodologies to ensure the reliability and functionality of integrated ...
Abstract: With the advent of Very-Large-Scale Integration (VLSI), testing has turned out to be much more troublesome as their size develops. Effective as these traditional VLSI testing methods are in ...
Theory and practice of testing and verification of VLSI systems. Topics include fault modeling, fault simulation, test generation, scan design and design for testability (DFT). Students develop ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback