Abstract: Conventional testing method of post-manufactures analog integrated circuits (ICs) is mainly relied on expensive automatic test equipment (ATE), which measure the specifications that included ...

Abstract: The paper shows an influence of a choice of autonomous testing structure on fault coverage in synchronous digital sequential circuit testing. In order to increase testability of sequential ...

Testing to see if a Boolean circuit computes the identically zero function is a fundamental problem in computational complexity. Known as the SAT (for satisfiability) problem, it is the first ...

Production of integrated circuits requires a large number of manufacturing steps at nanometric scale. Processes are not perfect so the test at the end of manufacturing aims at detecting all potential ...

Integrated circuits digital testing consists in detecting all defects that may appear during the manufacturing step or when the chip is embedded in its environment. For that purpose, it is mandatory ...

At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

Testing verifies that protection schemes meet their intended purpose, ensuring safety and system integrity. Function testing involves manual or electrical manipulation of components to confirm signal ...

I perform occasional turn ups of larger circuits for clients, in the range of 300mbit to 1gig. The ISP (often CenturyLink in Denver) provides the equipment, handing off to ethernet. Nothing ...

You can create a release to package software, along with release notes and links to binary files, for other people to use. Learn more about releases in our docs.