Test patterns play critical roles in physical layer compliance testing by challenging different aspects of a system. Receivers in HSS (high-speed serial) technology must be stable. When the average ...

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Notifications You must be signed in to change notification settings Think like an architect, not just a tester. Test automation is critical for ensuring software quality. However, designing robust and ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...

Advancements in semiconductor technology are making gate-level test generation more challenging. This is because a large amount of detailed structural information must be processed in the search ...

Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based ...

While semiconductor design engineers become more aware of silent data corruption (SDC) or silent data errors (SDE) caused by aging, environmental factors, and other issues, embedded test solutions are ...