X_train, y_train, X_val, y_val, X_test, y_test = tl.files.load_mnist_dataset(shape=(-1, 784)) ...

Majority of the silicon with-in a design is occupied by memories. Memories are more prone to failures than logic due to their density. Several techniques have been established to target and detect ...

“Spin Transfer Torque Magnetic Random Access Memory (STT-MRAM) is one of the most promising candidates to replace conventional embedded memory such as Static RAM and Dynamic RAM. However, due to the ...

Abstract: An MBIST interface can enable very high-quality test, which is required by emerging markets such as autonomous automotive, with much less impact to power, performance and area (PPA) than the ...