Abstract: With the increasing proportion of memory on SoC (System on Chip) chips, Memory Built-in Self Test (MBIST) has become a crucial component of Design for Testability (DFT) in SoC chip design.
Cadence Design Systemsは11月14日(米国時間)、同社のテストソリューション「Modus」が、高パフォーマンスのARMコアを採用したSoC開発の効率化に向け、ARM Memory Built-In Self Test(MBIST)インタフェースをサポートしたと発表した。 これによりCadenceでは、例えば ...
The objective of this project is to develop a Memory Built-In Self-Test (MBIST) system for evaluating a 256 x 4-bit Static Random Access Memory (SRAM) cell. The testing approach utilizes checkerboard ...
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eInfochips launches DAeRT (DFT Automated Execution and Reporting Tool) - an automated framework for the semiconductor industry, which provides a complete solution for DFT, starting from architecture ...
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