EDN

Handheld eye pattern analyzer conducts physical layer eye pattern measurements on the high speed interfaces

Anritsu Company introduces the Bit Master MP1026A Eye Pattern Analyzer, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces at ...
EDN

Handheld analyzer displays eye patterns

Anritsu Company Introduces First Handheld Solution for Eye Pattern Analysis of OC-192/STM-64, 10G Fibre Channel, and 10G Ethernet Bit Master MP1026A is Low-cost Instrument for 10 Gbps Mask Compliance ...
Business Wire

Anritsu Company Introduces Single Instrument That Conducts BER Measurements and Eye Pattern Analysis Simultaneously

SAN DIEGO--(BUSINESS WIRE)--Anritsu Company introduces the MP2100A BERTWave series that features a single-instrument solution that can conduct 10 Gbit/s BER measurements and eye pattern analysis ...
Electronics Weekly

Anritsu combines BER and eye analyser for device testing

Anritsu’s latest BERTWave series optical device measurement system combines BER measurements and eye pattern analysis in one package. For remote measurement in production environments, the MP2100A has ...
Electronic Design

Eye-Diagram Analysis Speeds DDR SDRAM Validation

Double-data-rate synchronous dynamic random access memory (DDR SDRAM) physical-layer testing is a crucial step in making sure devices comply with the JEDEC specification. The ultimate goal is to ...
Arabian Business

Getting the jitters

Serial transmission of data representing video and audio signals is standard practice across the broadcast industry. The advantages are many, yet with these advantages come a new set of parameters ...