In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification. The EBSD system, by Oxford Instruments, ...

The high sensitivity of the reflection electron microscopy (REM) technique to small changes in the crystal structure and composition of the top surface layers of various crystalline materials makes it ...

Using ultrahigh-intensity x-ray beams can cause the intensity of diffraction patterns from samples to drop Figure 1: An x-ray diffraction pattern obtained from a ...

Could you start by explaining your background in crystallography and how you began using the Rigaku Synergy-ED system? Fraser: I began my journey into crystallography at the University of Edinburgh in ...