In back-end semiconductor processing it is important to improve the performance of semiconductors due to the limitations of miniaturization in front-end processes. To achieve this goal, the industry ...

Abstract: Parasitic capacitance in test hardware can affect the performance of a test and lead to poor fault coverage and/or yield loss. In an ATE setup, characterizing the stray capacitance using ...

According to precedence, MOSFET datasheets show output capacitance at a single measured voltage. While these values were good enough for relative comparison between products in the past, it is ...

Designed and implemented a differential, single-slope, resettable integrator circuit on a soldered breadboard for component measurement. Using this circuit I then created a command-line interface for ...

TCL program to use SYSCOMP CGR-201 for a capacitance tester for Swipesense Hygiene Event Detector: 1- Events detection functionality: set the number of events to be tested from the GUI. The interval ...

Abstract: HBM tester parasitic capacitances are shown to degrade the current pulse rise-times on the ground path return. Rise-times longer than allowed in the HBM specification may cause failures on ...